​​​Sergei Devadze​

Publications

Journal / Periodical: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Authors: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Year: 2023