Publications

Preparation of Thermoplastic Cellulose Esters in [mTBNH][OAC] Ionic Liquid by Transesterification Reaction
Journal / Periodical: Polymers
Authors: Tarasova, Elvira; Savale, Nutan; Krasnou, Illia; Kudrjašova, Marina; Rjabovs, Vitalijs; Reile, Indrek; Vares, Lauri; Kallakas, Heikko; Kers, Jaan; Krumme, Andres
Year: 2023
Molecularly imprinted co-polymer for class-selective electrochemical detection of macrolide antibiotics in aqueous media
Journal / Periodical: Sensors and Actuators B: Chemical
Authors: Nguyen, V. B. C.; Ayankojo, A. G.; Reut, J.; Rappich, J.; Furchner, A.; Hinrichs, K.; Syritski, V.
Year: 2023
Preliminary results in using attention for increasing attack identification efficiency
Journal / Periodical: 2023 IEEE 16th International Conferenceon Software Testing, Verification andValidation Workshops, ICSTW 2023, 16-20 April 2023, Dublin, Ireland, Proceedings
Authors: Ahmad, Tanwir; Truscan, Dragos; Vain, Jüri
Year: 2023
Application of the LSTM models for Baltic Sea wave spectra estimation
Journal / Periodical: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Authors: Simon, Martin; Rikka, Sander; Nõmm, Sven; Alari, Victor
Year: 2023
Comparison of one- two- and three-dimensional CNN models for drawing-test-based diagnostics of the Parkinson’s disease
Journal / Periodical: Biomedical Signal Processing and Control
Authors: Wang, Xuechao; Huang, Junqing; Chatzakou, Marianna; Nõmm, Sven; Valla, Elli; Medijainen, Kadri; Taba, Pille; Toomela, Aaro; Ruzhansky, Michael
Year: 2023
On-Chip Sensors Data Collection and Analysis for SoC Health Management
Journal / Periodical: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023
Authors: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Year: 2023
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Journal / Periodical: Microelectronics Reliability
Authors: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Year: 2023
ML-Based Online Design Error Localization for RISC-V Implementations
Journal / Periodical: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Authors: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Year: 2023
DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Journal / Periodical: 2023 24Th International Symposium On Quality Electronic Design, Isqed
Authors: Taheri, Mahdi; Riazati, Mohammad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjodin, Mikael; Lisper, Bjorn
Year: 2023
DeepVigor: VulnerabIlity Value Ranges and Factors for DNNs’ Reliability Assessment
Journal / Periodical: 28th IEEE European Test Symposium (ETS), Venice, Italy, May 22-26, 2023
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2023
Improved PWM Based Sinewave Generation: Example of the Impedance Measurement
Journal / Periodical: Automatic Control and Computer Sciences
Authors: Abdullayev, A.; Annus, P.; Krivošei, A.; Metshein, M.; Märtens, O.; Rist, M.;
Year: 2023
On-Desk Model-Based Study for Evaluating the Effect of Squeezing the Arteries in Forearm on the Bioimpedance and Pressure of Blood
Journal / Periodical: Journal of Sensors
Authors: Metshein, M.; Annus, P.; Land, R.; Rist, M.; Min, M.; Lotamõis, K.; Märtens, O.
Year: 2023
Sensor-Location-Specific Joint Acquisition of Peripheral Artery Bioimpedance and Photoplethysmogram for Wearable Applications
Journal / Periodical: Sensors
Authors: Metshein, Margus; Abdullayev, Anar; Gautier, Antoine; Larras, Benoit; Frappe, Antoine; Cardiff, Barry; Annus, Paul; Land, Raul; Märtens, Olev
Year: 2023
A DSP-based EBI, ECG and PPG Measurement Platform
Journal / Periodical: IEEE Transactions on Instrumentation and Measurement
Authors: Abdullayev, A.; Rist, M.; Martens, O.; Metshein, M.; Larras, B.; Frappe, A.; Gautier, A.; Min, M.; John, D.; Cardiff, B.; Krivosei, A.; Annus, P.
Year: 2023
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