Publications

NURSE: A Distributed Architecture for Runtime Fault Management in Processor Designs
Authors: Santhosh, Ashwin; Jutman, Artur; Kaja, Endri; Ecker, Wolfgang; Jenihhin, Maksim
Year: 2026
Investigating the Impact of Soft Errors in GPU-accelerated Sparse DNNs
Journal / Periodical: 2026 IEEE 17th Latin American Circuits and System (LASCAS)
Authors: Mohammad Hasan Ahmadilivani, Josie E. Rodriguez Condia, Maksim Jenihhin, Matteo Sonza Reorda
Year: 2026
Progressive Training of Hybrid Clipped Rectified Linear Unit for Resilient Convolution Neural Networks
Journal / Periodical: IEEE Access
Authors: Mousavi, Seyedhamidreza; Ahmadilivani, Mohammad Hasan; Raik, Jaan; Jenihhin, Maksim; Daneshtalab, Masoud
Year: 2026
FT-Sparse: Algorithm-Based Fault Tolerance for Sparse CNNs Using Structured Sparsity in GPUs
Authors: Josie E. Rodriguez Condia, Mohammad Hasan Ahmadilivani$, Jaan Raik, Maksim Jenihhin, Matteo Sonza Reorda
Year: 2026
Reliability Assessment of Deep Neural Networks and Accelerators Across Design Stages
Authors: Mohammad Hasan Ahmadilivani, Natalia Cherezova, Michael Glaß, Juan-David Guerrero-Balaguera, Maksim Jenihhin, Angeliki Kritikakou, Robert Limas Sierra, Leticia Bolzani Poelhs, Jaan Raik, Lucas Roquet, Fernando Fernandes dos Santos, Felipe Augusto da Silva, Matteo Sonza Reorda, Alessandro Veronesi, Ernesto Cristopher Villegas Castillo, Josie E. Rodriguez Condia
Year: 2026
European Test Symposium Teams: an Anniversary Snapshot
Journal / Periodical: 2025 IEEE European Test Symposium (ETS)
Authors: Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Stefan, I.; Stan, O.; Corches, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersgluss, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W.; Vanhooren, R.; Chuang, P. -Y.; Marinissen, E. J.; Di Natale, G.; Barragan, M.; Maistri, P.; Mir, S.; Vatajelu, E. -I.; Bernardi, P.; Di Carlo, S.; Prinetto, P.; Reorda, M. Sonza; Violante, M.; Stratigopoulos, H. -G.; Michael, M. K.; Neophytou, S.; Hadjitheophanous, S.; Christou, K.; Skitsas, M.; Bosiol, A.; Deveautour, B.; Girard, P.; Traiolan, M.; Virazel, A.; dos Santos, E. Fernandes; Kritikakou, A.; Casagranda, G.; Vallero, M.; Vella, F.; Rech, P.; Poehls, L. M. Bolzani; Krstic, M.; Andjelkovic, M.; Vargas, F.; Tshagharyan, G.; Harutyunyan, G.; Vardanian, V.; Shoukourian, S.; Zorian, Y.; Dworak, J.; Nepal, K.; Manikas, T.; Taoui, M.; Fieback, M.; Gebregiorgis, A.; Bishnoi, R.; Hamdioui, S.; Chatterjee, A.; Saha, A.; Komarraju, S.; Ma, K.; Amarnath, C.; Tahoori, M.; Mayahinia, M.; Rajabalipanah, M.; Basharkhah, K.; Nosrati, N.; Jahanpeima, Z.; Navabi, Z.; Wunderlich, H. -J.; Hellebrand, S.
Year: 2025
ETS 2025 Foreword
Journal / Periodical: Proceedings of the European Test Workshop
Authors: Jutman, A.; Raik, J.; SonzaReorda, M.; Virazel, A.; Voyiatzis, I.; Soudris, D.; Taouil, M.; Lentaris, G.; Jenihhin, M.
Year: 2025
FORTALESA: Fault-tolerant reconfigurable systolic array for DNN inference
Journal / Periodical: Microprocessors and Microsystems
Authors: Cherezova, Natalia; Jutman, Artur; Jenihhin, Maksim
Year: 2025
AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators
Journal / Periodical: IEEE Transactions on Device and Materials Reliability
Authors: Taheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim
Year: 2025
RL-Agent-based Early-Exit DNN Architecture Search Framework
Journal / Periodical: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Authors: Taheri, Mahdi; Patne, Parth; Cherezova, Natalia; Mahani, Ali; Herglotz, Christian; Jenihhin, Maksim
Year: 2025
SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators
Journal / Periodical: Journal of Circuits, Systems and Computers
Authors: Pappalardo, Salvatore; Bellarmino, Nicolo'; Deveautour, Bastien; Bosio, Alberto; Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim
Year: 2025
SHIELD: PSO-Based Hardware Trojan Detection for Efficient and Low-Cost Defense
Journal / Periodical: Proceedings 2025 IEEE 31st International Symposium on on Line Testing and Robust System Design (IOLTS)
Authors: Hosseini, M.; Azarpeyvand, A.; Taheri, M.; Ghasempouri, T.; Jenihhin, M.
Year: 2025
GENIE: GENetIc Algorithm-Based REliability Assessment Methodology for Deep Neural Networks
Journal / Periodical: 2025 11th International Conference on Computing and Artificial Intelligence (ICCAI)
Authors: Nazari, S.; Taheri, M.; Azarpeyvand, A.; Afsharchi, M.; Herglotz, C.; Jenihhin, M.
Year: 2025
Reliability-Aware Hyperparameter Optimization for ANN-to-SNN Conversion
Journal / Periodical: Works in Progress in Embedded Computing Journal WiPiEC Journal
Authors: Sharifian, Saeed; Taheri, Mahdi; Rashtchi, Vahid; Azarpeyvand, Ali; Herglotz, Christian; Jenihhin, Maksim
Year: 2025