Publications

Structural Decision Diagrams in Digital Test
Authors: Ubar, Raimund; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur
Year: 2024
IJTAG-compatible Symptom-based SEU Monitors for FPGA DNN Accelerators
Journal / Periodical: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
Authors: Cherezova, Natalia; Jenihhin, Maksim; Jutman, Artur
Year: 2024
Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs
Journal / Periodical: 2024 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Authors: Selg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Year: 2024
A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks
Journal / Periodical: ACM Computing Surveys
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2024
Techniques for Reliability in Edge-AI Chips
Authors: Jenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud.
Year: 2024
Heterogeneous Approximation of DNN HW Accelerators based on Channels Vulnerability
Journal / Periodical: 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC)
Authors: Cherezova, Natalia; Pappalardo, Salvatore; Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Deveautour, Bastien; Bosio, Alberto; Raik, Jaan; Jenihhin, Maksim
Year: 2024
FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs
Journal / Periodical: Proceedings of 33rd IEEE Asian Test Symposium
Authors: Nazari, Samira; Taheri, Mahdi; Azarpeyvand, Ali; Afsharchi, Mohsen; Ghasempouri, Tara; Herglotz, Christian; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2024
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Journal / Periodical: 2024 25Th International Symposium On Quality Electronic Design, Isqed 2024
Authors: Taheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan
Year: 2024
The CMS Fast Beam Condition Monitor for HL-LHC
Journal / Periodical: Journal of Instrumentation
Authors: Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A. G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Liu, W. H.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V.; Pasztor, G.; Pari, M.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Shibin, K.; Steinbrueck, G.; Stickland, D.; Ujvari, B.; Wegrzyn, G. J.
Year: 2024
An optimized design of delay-and energy-efficient Booth multiplier
Journal / Periodical: e-Prime - Advances in Electrical Engineering Electronics and Energy
Authors: Rafiq, A.; Jenihhin, M.
Year: 2024
AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators
Journal / Periodical: Proceedings of the European Test Symposium
Authors: Taheri, M.; Cherezova, N.; Nazari, S.; Rafiq, A.; Azarpeyvand, A.; Ghasempouri, T.; Daneshtalab, M.; Raik, J.; Jenihhin, M.
Year: 2024
Techniques for Building Reliable and Energy-efficient Hardware Accelerators For Dynamic Deep Neural Networks
Authors: Kodamanchili, Rama Mounika; Jenihhin, Maksim
Year: 2024
Flexible Data Acquisition System with Custom Front-End for Ultrasonic NDT Research
Journal / Periodical: 2024 19th Biennial Baltic Electronics Conference (BEC)
Authors: Peng, C.; Ratassepp, M.; Annus, P.; Rist, M.; Land, R.; Märtens, O.
Year: 2024
Fractional Fourier Transform-Based Signal Separation for Ultrasonic Guided Wave Inspection of Plates
Journal / Periodical: Sensors
Authors: Peng, Chengxiang; Annus, Paul; Rist, Marek; Land, Raul; Ratassepp, Madis
Year: 2024