Publikatsioonid

Structural Decision Diagrams in Digital Test

Väljaanne: Springer Nature Switzerland AG 2024
Autorid: Ubar, Raimund; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur
Aasta: 2024
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AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators

Väljaanne: IEEE Transactions on Device and Materials Reliability
Autorid: Taheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim
Aasta: 2024
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A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks

Väljaanne: ACM Computing Surveys
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2024
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The CMS Fast Beam Condition Monitor for HL-LHC

Väljaanne: 16th Topical Seminar on Innovative Particle and Radiation Detectors (IPRD23), Siena, 25-29.09.23
Autorid: Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A. G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Liu, W. H.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J. ... Wegrzyn, G. J.
Aasta: 2024
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Reliability-Critical Computation Offloading in UAV Swarms

Väljaanne: IEEE Systems Journal
Autorid: Rahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, Yannick
Aasta: 2024
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DeepVigor: VulnerabIlity Value Ranges and Factors for DNNs’ Reliability Assessment

Väljaanne: 28th IEEE European Test Symposium (ETS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2023
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DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators

Väljaanne: 24th International Symposium on Quality Electronic Design (ISQED'23)
Autorid: Taheri, Mahdi; Riazati, Mohammad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjodin, Mikael; Lisper, Bjorn
Aasta: 2023
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ML-Based Online Design Error Localization for RISC-V Implementations

Väljaanne: IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Autorid: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Aasta: 2023
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Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications

Väljaanne: Microelectronics Reliability
Autorid: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Aasta: 2023
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On-Chip Sensors Data Collection and Analysis for SoC Health Management

Väljaanne: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Autorid: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Aasta: 2023
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