Publikatsioonid

Adaptive and efficient federated distillation with selective homomorphic encryption for edge AI
Väljaanne: Expert Systems with Applications
Autorid: Rahbari, Dadmehr; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2025
Design and Performance of the FBCM23 ASIC for the CMS Luminosity Measurement
Väljaanne: IEEE Transactions on Nuclear Science
Autorid: Kaplon, J.; Wegrzyn, G.; Obradovic, M.; Shibin, K.
Aasta: 2025
A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks
Väljaanne: ACM Computing Surveys
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2024
Special Session: Reliability Assessment Recipes for DNN Accelerators
Väljaanne: Proceedings of the IEEE VLSI Test Symposium
Autorid: Ahmadilivani, M.H.; Bosio, A.; Deveautour, B.; Dos Santos, F.F.; Guerrero-Balaguera, J.D.; Jenihhin, M.; Kritikakou, A.; Sierra, R.L.; Pappalardo, S.; Raik, J.; Condia, J.E.R.; Reorda, M.S.; Taheri, M.; Traiola, M.
Aasta: 2024
Techniques for Building Reliable and Energy-efficient Hardware Accelerators For Dynamic Deep Neural Networks
Autorid: Kodamanchili, Rama Mounika; Jenihhin, Maksim
Aasta: 2024
Reliability-Critical Computation Offloading in UAV Swarms
Väljaanne: IEEE Systems Journal
Autorid: Rahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, Yannick
Aasta: 2024
An optimized design of delay-and energy-efficient Booth multiplier
Väljaanne: e-Prime - Advances in Electrical Engineering Electronics and Energy
Autorid: Rafiq, A.; Jenihhin, M.
Aasta: 2024
AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators
Väljaanne: Proceedings of the European Test Symposium
Autorid: Taheri, M.; Cherezova, N.; Nazari, S.; Rafiq, A.; Azarpeyvand, A.; Ghasempouri, T.; Daneshtalab, M.; Raik, J.; Jenihhin, M.
Aasta: 2024
Keynote: Cost-Efficient Reliability for Edge-AI Chips
Väljaanne: Keynote: Cost-Efficient Reliability for Edge-AI Chips
Autorid: Jenihhin, M.; Taheri, M.; Cherezova, N.; Ahmadilivani, M.H.; Selg, H.; Jutman, A.; Shibin, K.; Tsertov, A.; Devadze, S.; Kodamanchili, R.M.; Rafiq, A.; Raik, J.; Daneshtalab, M.
Aasta: 2024
Techniques for Reliability in Edge-AI Chips
Autorid: Jenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud.
Aasta: 2024
Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning
Väljaanne: Proceedings - 2024 IEEE 30th International Symposium on On-line Testing and Robust System Design, IOLTS 2024
Autorid: Ahmadilivani, M.H.; Mousavi, S.; Raik, J.; Daneshtalab, M.; Jenihhin, M.
Aasta: 2024
Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs
Väljaanne: 2024 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Autorid: Selg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Aasta: 2024
Structural Decision Diagrams in Digital Test
Autorid: Ubar, Raimund; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur
Aasta: 2024
The CMS Fast Beam Condition Monitor for HL-LHC
Väljaanne: Journal of Instrumentation
Autorid: Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A. G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Liu, W. H.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V.; Pasztor, G.; Pari, M.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Shibin, K.; Steinbrueck, G.; Stickland, D.; Ujvari, B.; Wegrzyn, G. J.
Aasta: 2024