Publikatsioonid

FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs
Väljaanne: Proceedings of 33rd IEEE Asian Test Symposium
Autorid: Nazari, Samira; Taheri, Mahdi; Azarpeyvand, Ali; Afsharchi, Mohsen; Ghasempouri, Tara; Herglotz, Christian; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2024
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Foreword
Väljaanne: Proceedings 2024 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems Ddecs 2024
Autorid: Deniziak, S.; Sitek, P.; Jenihhin, M.; Steininger, A.; Schölzel, M.
Aasta: 2024
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Architectural Solutions for High-Speed Data Processing Demands of CERN LHC Detectors with FPGA and High-Level Synthesis
Väljaanne: 2024 Ieee Nordic Circuits and Systems Conference, Norcas 2024 - Proceedings
Autorid: Devadze, S.; Nielsen, C.E.; Mihhailov, D.; Ellervee, P.
Aasta: 2024
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The optimization, design and performance of the FBCM23 ASIC for the upgraded CMS beam monitoring system
Väljaanne: Journal of Instrumentation
Autorid: Kaplon, Jan; Wegrzyn, Grzegorz; Shibin, Konstantin; Barendregt, Marnix
Aasta: 2024
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An automated method for mining high-quality assertion sets
Väljaanne: Microprocessors and Microsystems
Autorid: Heidari Iman, Mohammad Reza; Raik, Jaan; Jenihhin, Maksim; Jervan, Gert; Ghasempouri, Tara
Aasta: 2023
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DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Väljaanne: 2023 24th International Symposium on Quality Electronic Design (ISQED)
Autorid: Taheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn
Aasta: 2023
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DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Väljaanne: 2023 28th IEEE European Test Symposium (ETS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2023
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APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors
Väljaanne: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Autorid: Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud
Aasta: 2023
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Holistic IJTAG-based External and Internal Fault Monitoring in UAVs
Väljaanne: 2023 IEEE 24th Latin American Test Symposium (LATS)
Autorid: Ahmed,Foisal; Jenihhin,Maksim
Aasta: 2023
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Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Väljaanne: Microelectronics Reliability
Autorid: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Aasta: 2023
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ML-Based Online Design Error Localization for RISC-V Implementations
Väljaanne: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Autorid: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Aasta: 2023
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Special Session: Approximation and Fault Resiliency of DNN Accelerators
Väljaanne: 2023 IEEE 41st VLSI Test Symposium (VTS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan;
Aasta: 2023
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Enhancing Fault Resilience of QNNs by Selective Neuron Splitting
Väljaanne: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim;
Aasta: 2023
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Applying RIS-Based Communication for Collaborative Computing in a Swarm of Drones
Väljaanne: IEEE Access
Autorid: Rahbari, Dadmehr; Alam, Muhammad Mahtab; Le Moullec, Yannick; Jenihhin, Maksim
Aasta: 2023
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