Publications

ETAGi välisteaduskoostöö toetusmeetmete mõju. Kvalitatiivuuringu tulemused
Authors: Riivits-Arkonsuo, Iivi; Saia, Koidu; Reidolf, Merli; Södör, Kaja; Kutsar, Dagmar; Mäger, Kadri.
Year: 2024
Special Session: Reliability Assessment Recipes for DNN Accelerators
Journal / Periodical: Proceedings of the IEEE VLSI Test Symposium
Authors: Ahmadilivani, M.H.; Bosio, A.; Deveautour, B.; Dos Santos, F.F.; Guerrero-Balaguera, J.D.; Jenihhin, M.; Kritikakou, A.; Sierra, R.L.; Pappalardo, S.; Raik, J.; Condia, J.E.R.; Reorda, M.S.; Taheri, M.; Traiola, M.
Year: 2024
Techniques for Building Reliable and Energy-efficient Hardware Accelerators For Dynamic Deep Neural Networks
Authors: Kodamanchili, Rama Mounika; Jenihhin, Maksim
Year: 2024
Techniques for Reliability in Edge-AI Chips
Authors: Jenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud.
Year: 2024
Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs
Journal / Periodical: 2024 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Authors: Selg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Year: 2024
Zero-Memory-Overhead Clipping-Based Fault Tolerance for LSTM Deep Neural Networks
Journal / Periodical: 2024 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Authors: Parchekani, Bahram; Nazari, Samira; Ahmadilivani, Mohammad Hasan; Azarpeyvand, Ali; Raik, Jaan; Ghasempouri, Tara; Daneshtalab, Masoud
Year: 2024
The optimization, design and performance of the FBCM23 ASIC for the upgraded CMS beam monitoring system
Journal / Periodical: Journal of Instrumentation
Authors: Kaplon, Jan; Wegrzyn, Grzegorz; Shibin, Konstantin; Barendregt, Marnix
Year: 2024
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Journal / Periodical: 2024 25Th International Symposium On Quality Electronic Design, Isqed 2024
Authors: Taheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan
Year: 2024
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Journal / Periodical: 2024 27Th International Symposium On Design & Diagnostics Of Electronic Circuits & Systems, Ddecs
Authors: Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim; Pappalardo, Salvatore; Jimenez, Paul; Deveautour, Bastien; Bosio, Alberto
Year: 2024
Cross-layer Bayesian Network for UAV Health Monitoring
Journal / Periodical: 2024 2Nd International Conference On Unmanned Vehicle Systems-Oman, Uvs
Authors: Ahmed, Foisal; Jenihhin, Maksim
Year: 2024
Architectural Solutions for High-Speed Data Processing Demands of CERN LHC Detectors with FPGA and High-Level Synthesis
Journal / Periodical: 2024 Ieee Nordic Circuits and Systems Conference, Norcas 2024 - Proceedings
Authors: Devadze, S.; Nielsen, C.E.; Mihhailov, D.; Ellervee, P.
Year: 2024
An optimized design of delay-and energy-efficient Booth multiplier
Journal / Periodical: e-Prime - Advances in Electrical Engineering Electronics and Energy
Authors: Rafiq, A.; Jenihhin, M.
Year: 2024
AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators
Journal / Periodical: Proceedings of the European Test Symposium
Authors: Taheri, M.; Cherezova, N.; Nazari, S.; Rafiq, A.; Azarpeyvand, A.; Ghasempouri, T.; Daneshtalab, M.; Raik, J.; Jenihhin, M.
Year: 2024
Keynote: Cost-Efficient Reliability for Edge-AI Chips
Journal / Periodical: Keynote: Cost-Efficient Reliability for Edge-AI Chips
Authors: Jenihhin, M.; Taheri, M.; Cherezova, N.; Ahmadilivani, M.H.; Selg, H.; Jutman, A.; Shibin, K.; Tsertov, A.; Devadze, S.; Kodamanchili, R.M.; Rafiq, A.; Raik, J.; Daneshtalab, M.
Year: 2024