Publications

Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs
Journal / Periodical: 2024 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Authors: Selg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Year: 2024
A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks
Journal / Periodical: ACM Computing Surveys
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2024
Techniques for Reliability in Edge-AI Chips
Authors: Jenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud.
Year: 2024
Heterogeneous Approximation of DNN HW Accelerators based on Channels Vulnerability
Journal / Periodical: 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC)
Authors: Cherezova, Natalia; Pappalardo, Salvatore; Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Deveautour, Bastien; Bosio, Alberto; Raik, Jaan; Jenihhin, Maksim
Year: 2024
FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs
Journal / Periodical: Proceedings of 33rd IEEE Asian Test Symposium
Authors: Nazari, Samira; Taheri, Mahdi; Azarpeyvand, Ali; Afsharchi, Mohsen; Ghasempouri, Tara; Herglotz, Christian; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2024
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Journal / Periodical: 2024 25Th International Symposium On Quality Electronic Design, Isqed 2024
Authors: Taheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan
Year: 2024
The CMS Fast Beam Condition Monitor for HL-LHC
Journal / Periodical: Journal of Instrumentation
Authors: Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A. G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Liu, W. H.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V.; Pasztor, G.; Pari, M.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Shibin, K.; Steinbrueck, G.; Stickland, D.; Ujvari, B.; Wegrzyn, G. J.
Year: 2024
An optimized design of delay-and energy-efficient Booth multiplier
Journal / Periodical: e-Prime - Advances in Electrical Engineering Electronics and Energy
Authors: Rafiq, A.; Jenihhin, M.
Year: 2024
AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators
Journal / Periodical: Proceedings of the European Test Symposium
Authors: Taheri, M.; Cherezova, N.; Nazari, S.; Rafiq, A.; Azarpeyvand, A.; Ghasempouri, T.; Daneshtalab, M.; Raik, J.; Jenihhin, M.
Year: 2024
Techniques for Building Reliable and Energy-efficient Hardware Accelerators For Dynamic Deep Neural Networks
Authors: Kodamanchili, Rama Mounika; Jenihhin, Maksim
Year: 2024
Special Session: Reliability Assessment Recipes for DNN Accelerators
Journal / Periodical: Proceedings of the IEEE VLSI Test Symposium
Authors: Ahmadilivani, M.H.; Bosio, A.; Deveautour, B.; Dos Santos, F.F.; Guerrero-Balaguera, J.D.; Jenihhin, M.; Kritikakou, A.; Sierra, R.L.; Pappalardo, S.; Raik, J.; Condia, J.E.R.; Reorda, M.S.; Taheri, M.; Traiola, M.
Year: 2024
Reliability-Critical Computation Offloading in UAV Swarms
Journal / Periodical: IEEE Systems Journal
Authors: Rahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, Yannick
Year: 2024
Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning
Journal / Periodical: Proceedings - 2024 IEEE 30th International Symposium on On-line Testing and Robust System Design, IOLTS 2024
Authors: Ahmadilivani, M.H.; Mousavi, S.; Raik, J.; Daneshtalab, M.; Jenihhin, M.
Year: 2024
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Journal / Periodical: 2024 27Th International Symposium On Design & Diagnostics Of Electronic Circuits & Systems, Ddecs
Authors: Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim; Pappalardo, Salvatore; Jimenez, Paul; Deveautour, Bastien; Bosio, Alberto
Year: 2024