Publications

AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators
Journal / Periodical: Proceedings of the European Test Symposium
Authors: Taheri, M.; Cherezova, N.; Nazari, S.; Rafiq, A.; Azarpeyvand, A.; Ghasempouri, T.; Daneshtalab, M.; Raik, J.; Jenihhin, M.
Year: 2024
Keynote: Cost-Efficient Reliability for Edge-AI Chips
Journal / Periodical: Keynote: Cost-Efficient Reliability for Edge-AI Chips
Authors: Jenihhin, M.; Taheri, M.; Cherezova, N.; Ahmadilivani, M.H.; Selg, H.; Jutman, A.; Shibin, K.; Tsertov, A.; Devadze, S.; Kodamanchili, R.M.; Rafiq, A.; Raik, J.; Daneshtalab, M.
Year: 2024
On-Chip Sensors Data Collection and Analysis for SoC Health Management
Journal / Periodical: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023
Authors: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Year: 2023
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Journal / Periodical: Microelectronics Reliability
Authors: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Year: 2023
ML-Based Online Design Error Localization for RISC-V Implementations
Journal / Periodical: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Authors: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Year: 2023
DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Journal / Periodical: 2023 24Th International Symposium On Quality Electronic Design, Isqed
Authors: Taheri, Mahdi; Riazati, Mohammad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjodin, Mikael; Lisper, Bjorn
Year: 2023
DeepVigor: VulnerabIlity Value Ranges and Factors for DNNs’ Reliability Assessment
Journal / Periodical: 28th IEEE European Test Symposium (ETS), Venice, Italy, May 22-26, 2023
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2023
Enhancing Fault Resilience of QNNs by Selective Neuron Splitting
Journal / Periodical: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim;
Year: 2023
Analyzing Side-Channel Attack Vulnerabilities at RTL
Journal / Periodical: 2023 Ieee 24Th Latin American Test Symposium, Lats
Authors: Lai, Xinhui; Jenihhin, Maksim
Year: 2023
An automated method for mining high-quality assertion sets
Journal / Periodical: Microprocessors and Microsystems
Authors: Heidari Iman, Mohammad Reza; Raik, Jaan; Jenihhin, Maksim; Jervan, Gert; Ghasempouri, Tara
Year: 2023
Applying RIS-Based Communication for Collaborative Computing in a Swarm of Drones
Journal / Periodical: IEEE Access
Authors: Rahbari, Dadmehr; Alam, Muhammad Mahtab; Le Moullec, Yannick; Jenihhin, Maksim
Year: 2023
Holistic IJTAG-based External and Internal Fault Monitoring in UAVs
Journal / Periodical: 2023 IEEE 24th Latin American Test Symposium (LATS)
Authors: Ahmed,Foisal; Jenihhin,Maksim
Year: 2023
DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Journal / Periodical: 2023 24th International Symposium on Quality Electronic Design (ISQED)
Authors: Taheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn
Year: 2023
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Journal / Periodical: 2023 28th IEEE European Test Symposium (ETS)
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2023