Publications

Adaptive Fault Resilience for Early-Exit DNNs
Journal / Periodical: 2025 IEEE International Test Conference in Asia (ITC-Asia)
Authors: Kodamanchili, Rama Mounika; Cherezova, Natalia; Taheri, Mahdi; Jenihhin, Maksim
Year: 2025
Architectural Exploration and Implementation of CERN LHC Trigger Algorithm With FPGA
Journal / Periodical: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Authors: Devadze, Sergei; Nielsen, Christine E.; Cherezova, Natalia; Mihhailov, Dmitri; Ellervee, Peeter
Year: 2025
Characterization and beam test measurements of CMS Phase-2 luminometers
Journal / Periodical: Nuclear Instruments and Methods in Physics Research. Section A: Accelerators Spectrometers Detectors and Associated Equipment
Authors: Kadlecsik, A.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D.; Obradovic, M.; Orfanelli, S.; Pari, M.; Pasztor, G.; Carneiro, F. L. Pereira; Princova, M.; Ristic, B.; Romero, C.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Shibin, K.; Spanier, S.; Steinbrueck, G.; Stickland, D. P.; Tsirou, A.; Ujvari, B.; Velasco, M. M.; Verdini, P. G.; Wegrzyn, G. J.; Wilbern, D.; Winney, P. D.
Year: 2025
Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
Journal / Periodical: Proceedings of Science
Authors: Shibin, K.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmáros, B.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V.; Pásztor, G.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Steinbrueck, G.; Stickland, D.; Wegrzyn, G.J.
Year: 2025
The CMS Phase-2 Fast Beam Condition Monitor prototype test with beam
Journal / Periodical: Journal of Instrumentation
Authors: Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Gyongyosi, B.; Jenihhin, M.; Kadlecsik, A.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D.; Obradovic, M.; Orfanelli, S.; Pari, M.; Pasztor, G.; Carneiro, F. L. Pereira; Princova, M.; Ristic, B.; Romero, C.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Shibin, K.; Spanier, S.; Steinbrueck, G.; Stickland, D. P.; Tsirou, A.; Ujvari, B.; Velasco, M.; Verdini, P. G.; Wegrzyn, G. J.; Wiehe, M.; Wilbern, D.; Winney, P. D.
Year: 2025
XMULT: An Energy-Efficient Design of Approximate Multiplier
Journal / Periodical: 2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
Authors: Rafiq, Ahsan; Jenihhin, Maksim
Year: 2025
AxEnMULT: Design of an Efficient and Reliable Approximate Encoding-Based Multiplier
Journal / Periodical: 2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Authors: Rafiq, Ahsan; Bosio, Alberto; Pappalardo, Salvatore; Jenihhin, Maksim
Year: 2025
An Efficient Architecture for Edge AI Federated Learning with Homomorphic Encryption
Journal / Periodical: IEEE Access
Authors: Rahbari, Dadmehr; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2025
Does Fault Tolerance Safeguard DNNs Against Bitfiip Attacks? A Case Study
Journal / Periodical: 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Authors: Ahmadilivani, Mohammad Hasan; Kobayashi, Yuto; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2025
Adaptive and efficient federated distillation with selective homomorphic encryption for edge AI
Journal / Periodical: Expert Systems with Applications
Authors: Rahbari, Dadmehr; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2025
From Structured Labs to Agile Teams: A Curriculum-Based Approach to Active Learning in First-Year Computer Engineering
Journal / Periodical: 2025 IEEE Frontiers in Education Conference (FIE)
Authors: Ruberg, Priit; Ellervee, Peeter; Heinsar, Risto; Selg, Hardi; Eek, Andres
Year: 2025
Keynote: Cost-Efficient Reliability for Edge-AI Chips
Journal / Periodical: Keynote: Cost-Efficient Reliability for Edge-AI Chips
Authors: Jenihhin, M.; Taheri, M.; Cherezova, N.; Ahmadilivani, M.H.; Selg, H.; Jutman, A.; Shibin, K.; Tsertov, A.; Devadze, S.; Kodamanchili, R.M.; Rafiq, A.; Raik, J.; Daneshtalab, M.
Year: 2024
Structural Decision Diagrams in Digital Test
Authors: Ubar, Raimund; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur
Year: 2024
IJTAG-compatible Symptom-based SEU Monitors for FPGA DNN Accelerators
Journal / Periodical: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
Authors: Cherezova, Natalia; Jenihhin, Maksim; Jutman, Artur
Year: 2024