Publications

Cross-layer Bayesian Network for UAV Health Monitoring
Journal / Periodical: 2024 2Nd International Conference On Unmanned Vehicle Systems-Oman, Uvs
Authors: Ahmed, Foisal; Jenihhin, Maksim
Year: 2024
Foreword
Journal / Periodical: Proceedings 2024 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems Ddecs 2024
Authors: Deniziak, S.; Sitek, P.; Jenihhin, M.; Steininger, A.; Schölzel, M.
Year: 2024
Architectural Solutions for High-Speed Data Processing Demands of CERN LHC Detectors with FPGA and High-Level Synthesis
Journal / Periodical: 2024 Ieee Nordic Circuits and Systems Conference, Norcas 2024 - Proceedings
Authors: Devadze, S.; Nielsen, C.E.; Mihhailov, D.; Ellervee, P.
Year: 2024
The optimization, design and performance of the FBCM23 ASIC for the upgraded CMS beam monitoring system
Journal / Periodical: Journal of Instrumentation
Authors: Kaplon, Jan; Wegrzyn, Grzegorz; Shibin, Konstantin; Barendregt, Marnix
Year: 2024
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Journal / Periodical: Microelectronics Reliability
Authors: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Year: 2023
On-Chip Sensors Data Collection and Analysis for SoC Health Management
Journal / Periodical: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023
Authors: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Year: 2023
ML-Based Online Design Error Localization for RISC-V Implementations
Journal / Periodical: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Authors: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Year: 2023
DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Journal / Periodical: 2023 24th International Symposium on Quality Electronic Design (ISQED)
Authors: Taheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn
Year: 2023
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Journal / Periodical: 2023 28th IEEE European Test Symposium (ETS)
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Year: 2023
APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors
Journal / Periodical: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Authors: Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud
Year: 2023
Special Session: Approximation and Fault Resiliency of DNN Accelerators
Journal / Periodical: 2023 IEEE 41st VLSI Test Symposium (VTS)
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan;
Year: 2023
Enhancing Fault Resilience of QNNs by Selective Neuron Splitting
Journal / Periodical: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
Authors: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim;
Year: 2023
Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
Journal / Periodical: Journal of Physics: Conference Series
Authors: Shibin, Konstantin; Auzinger, Georg; Bakhshiansohi, Hamed; Dabrowski, Anne; Dierlamm, Alexander; Dragicevic, Marko; Gholami, Asghar; Gomez, Gervasio; Guthoff, Moritz; Haranko, Mykyta; Honma, Alan; Jenihhin, Maksim; Kaplon, Jan; Karacheban, Olena; Korcsmáros, Berta; Lokhovtskiy, Arkady; Loos, Robert; Mallows, Sophie; Michel, John; Myronenko, Volodymyr; Pásztor, Gabriella; Schwandt, Jörn; Sedghi, Mohammad; Shevelev, Alexey; Steinbrueck, Georg; Stickland, David; Wegrzyn, Grzegorz Jan;
Year: 2023
An automated method for mining high-quality assertion sets
Journal / Periodical: Microprocessors and Microsystems
Authors: Heidari Iman, Mohammad Reza; Raik, Jaan; Jenihhin, Maksim; Jervan, Gert; Ghasempouri, Tara
Year: 2023