Publikatsioonid

An automated method for mining high-quality assertion sets
Väljaanne: Microprocessors and Microsystems
Autorid: Heidari Iman, Mohammad Reza; Raik, Jaan; Jenihhin, Maksim; Jervan, Gert; Ghasempouri, Tara
Aasta: 2023
DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Väljaanne: 2023 24th International Symposium on Quality Electronic Design (ISQED)
Autorid: Taheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn
Aasta: 2023
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Väljaanne: 2023 28th IEEE European Test Symposium (ETS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2023
APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors
Väljaanne: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Autorid: Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud
Aasta: 2023
Holistic IJTAG-based External and Internal Fault Monitoring in UAVs
Väljaanne: 2023 IEEE 24th Latin American Test Symposium (LATS)
Autorid: Ahmed,Foisal; Jenihhin,Maksim
Aasta: 2023
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Väljaanne: Microelectronics Reliability
Autorid: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Aasta: 2023
ML-Based Online Design Error Localization for RISC-V Implementations
Väljaanne: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Autorid: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Aasta: 2023
Special Session: Approximation and Fault Resiliency of DNN Accelerators
Väljaanne: 2023 IEEE 41st VLSI Test Symposium (VTS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan;
Aasta: 2023
Enhancing Fault Resilience of QNNs by Selective Neuron Splitting
Väljaanne: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim;
Aasta: 2023
Applying RIS-Based Communication for Collaborative Computing in a Swarm of Drones
Väljaanne: IEEE Access
Autorid: Rahbari, Dadmehr; Alam, Muhammad Mahtab; Le Moullec, Yannick; Jenihhin, Maksim
Aasta: 2023
Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
Väljaanne: Journal of Physics: Conference Series
Autorid: Shibin, Konstantin; Auzinger, Georg; Bakhshiansohi, Hamed; Dabrowski, Anne; Dierlamm, Alexander; Dragicevic, Marko; Gholami, Asghar; Gomez, Gervasio; Guthoff, Moritz; Haranko, Mykyta; Honma, Alan; Jenihhin, Maksim; Kaplon, Jan; Karacheban, Olena; Korcsmáros, Berta; Lokhovtskiy, Arkady; Loos, Robert; Mallows, Sophie; Michel, John; Myronenko, Volodymyr; Pásztor, Gabriella; Schwandt, Jörn; Sedghi, Mohammad; Shevelev, Alexey; Steinbrueck, Georg; Stickland, David; Wegrzyn, Grzegorz Jan;
Aasta: 2023
On-Chip Sensors Data Collection and Analysis for SoC Health Management
Väljaanne: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023
Autorid: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Aasta: 2023
Analyzing Side-Channel Attack Vulnerabilities at RTL
Väljaanne: 2023 IEEE 24th Latin American Test Symposium Lats 2023
Autorid: Lai, Xinhui; Jenihhin, Maksim
Aasta: 2023
Foreword
Väljaanne: Proceedings 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems Ddecs 2023
Autorid: Jenihhin, M.; Mentens, N.; Kubatova, H.; Raik, J.
Aasta: 2023