Publikatsioonid

A DSP-based EBI, ECG and PPG Measurement Platform

Väljaanne: IEEE Transactions on Instrumentation and Measurement
Autorid: Abdullayev, A.; Rist, M.; Martens, O.; Metshein, M.; Larras, B.; Frappe, A.; Gautier, A.; Min, M.; John, D.; Cardiff, B.; Krivosei, A.; Annus, P.
Aasta: 2023
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Sensor-Location-Specific Joint Acquisition of Peripheral Artery Bioimpedance and Photoplethysmogram for Wearable Applications

Väljaanne: Sensors
Autorid: Metshein, Margus; Abdullayev, Anar; Gautier, Antoine; Larras, Benoit; Frappe, Antoine; Cardiff, Barry; Annus, Paul; Land, Raul; Märtens, Olev
Aasta: 2023
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On-Desk Model-Based Study for Evaluating the Effect of Squeezing the Arteries in Forearm on the Bioimpedance and Pressure of Blood

Väljaanne: Journal of Sensors
Autorid: Metshein, M.; Annus, P.; Land, R.; Rist, M.; Min, M.; Lotamõis, K.; Märtens, O.
Aasta: 2023
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Improved PWM Based Sinewave Generation: Example of the Impedance Measurement

Väljaanne: Automatic Control and Computer Sciences
Autorid: Abdullayev, A.; Annus, P.; Krivošei, A.; Metshein, M.; Märtens, O.; Rist, M.;
Aasta: 2023
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DeepVigor: VulnerabIlity Value Ranges and Factors for DNNs’ Reliability Assessment

Väljaanne: 28th IEEE European Test Symposium (ETS), Venice, Italy, May 22-26, 2023
Autorid: Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim
Aasta: 2023
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DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators

Väljaanne: 2023 24Th International Symposium On Quality Electronic Design, Isqed
Autorid: Taheri, Mahdi; Riazati, Mohammad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjodin, Mikael; Lisper, Bjorn
Aasta: 2023
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ML-Based Online Design Error Localization for RISC-V Implementations

Väljaanne: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Autorid: Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Aasta: 2023
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Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications

Väljaanne: Microelectronics Reliability
Autorid: Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur
Aasta: 2023
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On-Chip Sensors Data Collection and Analysis for SoC Health Management

Väljaanne: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023
Autorid: Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton
Aasta: 2023
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Zero-knowledge in Easycrypt

Väljaanne: 2023 IEEE 36th Computer Security Foundations Symposium (CSF)
Autorid: Firsov, Denis; Unruh, Dominique
Aasta: 2023
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